Stem Microscope

for the multimodal characterization of nanoscale morphological, chemical, and structural properties of synthetic particles, thin films, and functional materials, with unparalleled usability and exceptional 4D-STEM performance.input:
output:Syncing of Scanning with Diffraction Imaging, EDS Acquisition, and Beam Blanking.

4D-STEM data analysis and processing in near real-time

Electron Beam Precession and near-UHV provide performance advantages.

A novel approach to the user experience of STEM

4D-STEM Analyticalinput:
output:The complete picture of the interaction between the electron beam and the specimeninput:
output:4D-STEM is the preferred microscopy technique for the multimodal, true nanoscale characterization of material properties, including morphology, chemistry, and structure. TESCAN TENSOR rapidly and precisely synchronizes the acquisition of a diffraction pattern and an EDS spectrum at each pixel in the STEM dataset. The complete picture of the electron beam-specimen interaction is encapsulated by the diffraction and spectroscopy data, which can be used to derive a diverse array of material properties.input:
output:Near-real-time analysis and processing of 4D-STEM datainput:
output:Explore, TENSOR’s integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets, is a truly unique feature of TESCAN TENSOR.input:
output:Explore provides Material Scientists, Semiconductor Researchers and Failure Analysis, and Crystallographers with 4D-STEM measurements without necessitating specialized knowledge of STEM optics or 4D-STEM data analysis and post-processing. input:
output:Advanced users are granted the capacity to modify the preset optimized optical properties for each STEM or 4D-STEM measurement to optimize their preferences. Furthermore,