Optical Profiler
| Type | Optical, Digital |
| Observation Technique | 3D |
| Applications | Medical |
| Configuration | Benchtop |
Description
A dedicated system, the S wide, is engineered to rapidly measure large sample areas of up to 300 x 300 mm. It integrates all the advantages of a digital microscope into a high-resolution measuring instrument. With a single button for acquisition, it is exceedingly straightforward.SOLUTIONSinput:
output:
3D Optical Metrology System for a Large AreaAdvanced manufacturingConsumer electronics
Archaeology & PaleontologyMedical devicesThe following industries are included in this list: – Molding – Optics – Watch industry
Repeatability of sub-micron height throughout the entire extended area
Height measurement of up to 40 mm in a single shot without Z scanningBi-telecentric lenses with extremely low field distortion provide precise metrology.input:
output:Deviation from 3D CAD models in terms of formproviding the geometric difference and tolerance measurementBi-telecentric lenses with extremely low field distortion that enable precise metrologyinput:
output:Deviation from 3D CAD models in terms of formproviding the geometric difference and tolerance measurement
Shipping & Delivery
MAECENAS IACULIS
Vestibulum curae torquent diam diam commodo parturient penatibus nunc dui adipiscing convallis bulum parturient suspendisse parturient a.Parturient in parturient scelerisque nibh lectus quam a natoque adipiscing a vestibulum hendrerit et pharetra fames nunc natoque dui.
ADIPISCING CONVALLIS BULUM
- Vestibulum penatibus nunc dui adipiscing convallis bulum parturient suspendisse.
- Abitur parturient praesent lectus quam a natoque adipiscing a vestibulum hendre.
- Diam parturient dictumst parturient scelerisque nibh lectus.
Scelerisque adipiscing bibendum sem vestibulum et in a a a purus lectus faucibus lobortis tincidunt purus lectus nisl class eros.Condimentum a et ullamcorper dictumst mus et tristique elementum nam inceptos hac parturient scelerisque vestibulum amet elit ut volutpat.
